OptLab-UW   Software for the determination of optical material parameters
              with PerkinElmer UVWinLab (Vers. 2.0-3.0) for Lambda 19, 18
              and Lambda 900, 800

The optical appearance of materials is of basic relevance for many applications. This can be the color of a transparent or opaque material, the blocking characteristics of protective glasses, or the sunlight transfer capability of window glasses. Generally an adequately recorded spectrum of the sample contains all information required. However it is easier to process single values in order to make an objective and verifiable decision. Therefore the spectral data are generally condensed by an appropriate convolution algorithm to a single value. The OptLab software performs this type of calculation starting from a recorded spectrum. Generally the discussed calculations are derived from national and international standards like DIN, EN, ANSI, JIST, etc..

OptLab-UW is an extension to the PerkinElmer UVWinLab application software for UV/Vis and UV/Vis/NIR spectrometry version 2.0-3.0. UVWinLab provides all facilities to scan spectra with a Lambda series UV/Vis or UV/Vis/NIR spectrometer like Lambda 18 or Lambda 19 and Lambda 800 or Lambda 900. Furthermore the software provides means for spectral graphics, data storage and retrieval, and basic arithmetic data manipulations.

OptLab-UW uses basic UVWinLab functions like the graphic routines. OptLab can be invoked as a separate program or from within UVWinLab. In this case OptLab directly accesses the spectra stored in the UVWinLab data region. Additionally, OptLab can be integrated into a UVWinLab method as an ‘end-of-run’ application. This mode performs the required OptLab calculations automatically after data recording.

        Figure 1 OptLab Window

OptLab-UW performs a defined number of calculations. Additionally it is possible to define a sample thickness transformation and an ordinate range for the graphical spectrum display. All settings are summarized as a method to simplify repeated operations for routine applications. Unlimited numbers of methods can be stored under selected names.

To characterize transparent materials it is sometimes necessary to generate data based on a standard sample thickness. The sample thickness recalculation of an actual sample spectrum can be based on a single reflectance value, or on the material refractive index, or on a full single-surface reflectance spectrum.

The user can easily employ an editor to reorganize or redefine the choice of parameters calculated by OptLab-UW . It also possible to introduce new parameters with new data sets, which are based on the available algorithms.

Reports are generated through the UVWinLab Report Builder facility. This allows the numerical values to be printed together with the spectrum. A template is applied to define position, size, font etc. of the various elements. Customer-specific information like company name can be included.

System requirements
OptLab requires an installation of PerkinElmer UVWinLab vers. 2.0-3.0, Windows 95 or higher, Windows 2000.